WENZEL Mobile Measurement Systems and Software
WENZEL offers mobile measurement systems for real-time 3D inspection of parts directly in the production environment. The portable WM | MMA coordinate measuring manipulators enable contact and non-contact measurements, 3D scanning, comparison with CAD models, and reverse engineering.
WENZEL software enables measurement programming, data processing, and analysis. The WM | Quartis, WM | Gear, and WM | PointMaster solutions, along with specialized software modules, are used for coordinate measurements, gear inspection, 3D data analysis, and complex surface analysis.
WENZEL’s mobile systems and software complement the company’s comprehensive solutions for industrial metrology, quality control, and the automation of measurement processes.
A portable laser 3D scanner for fast, non-contact digitization of parts and complex surfaces. It is used for geometric inspection, comparison with CAD models, reverse engineering, and the creation of digital 3D models.
A portable multi-axis measuring system for 3D inspection of parts directly on the production floor. It enables contact measurements and, when equipped with a laser scanner, non-contact scanning of complex surfaces. Suitable for quality control, digitization, and reverse engineering.
A compact automated 3D scanning system that combines the WENZEL mScan scanner, a collaborative robot, and a rotary table. It enables automatic and repeatable scanning of parts for quality control, batch measurements, and reverse engineering.
WENZEL WM software solutions are designed to manage measurements and process and analyze the resulting data. The software supports WENZEL coordinate measuring machines, mobile measuring systems, and optical measuring systems.
The product line includes WM | Quartis, WM | Gear, WM | Gear Analyzer, WM | PointMaster, WM | Blade Analyzer, WM | SYS Analyzer, and WM | DesignMaster, and covers tasks such as coordinate measurements, inspection of gears and complex surfaces, 3D data processing, working with CAD models, and analysis of measurement processes.
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